Aberration-Corrected STEM - More than just Higher Resolution.
| Autor: | Pennycook, S, Chisholm, M, Lupini, A, Peng, Y, Varela, M, Benthem, K van, Borisevich, A, Jonge, N de, Oxley, M |
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| Zdroj: | Microscopy & Microanalysis; Aug2006 Supplement, Vol. 12 Issue S02, p132-133, 2p |
| Databáze: | Complementary Index |
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