| Autor: |
Ratliff, L. P., Gillaspy, J. D. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2001, Vol. 576 Issue 1, p935, 4p |
| Abstrakt: |
We have studied the modification of mica surfaces due to the impact of Xe[sup 44+] ions by imaging the ion-exposed surfaces with atomic force microscopy in vacuum. By incorporating the microscope into the vacuum chamber where the samples are exposed to the ions, we rule out posterior modification of these features in air. The features, raised bumps 19(2) nm in diameter, are similar to those imaged previously in air, however, their heights appear to be larger than previously reported. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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