References.

Předmět:
Zdroj: Foundations & Trends in Electronic Design Automation; 2010, Vol. 4 Issue 2/3, p211-221, 11p
Abstrakt: References for the book "Radiation-Induced Soft Errors: A Chip-Level Modeling Perspective," by Norbert Seifert are presented.
Databáze: Complementary Index