References.
Předmět: | |
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Zdroj: | Foundations & Trends in Electronic Design Automation; 2010, Vol. 4 Issue 2/3, p211-221, 11p |
Abstrakt: | References for the book "Radiation-Induced Soft Errors: A Chip-Level Modeling Perspective," by Norbert Seifert are presented. |
Databáze: | Complementary Index |
Externí odkaz: |