| Autor: |
Argiolas, N., Bazzan, M., Ciampolillo, M. V., Pozzobon, P., Sada, C., Saoner, L., Zaltron, A. M., Bacci, L., Minzioni, P., Nava, G., Parravicini, J., Yan, W., Cristiani, I., Degiorgio, V. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; Nov2010, Vol. 108 Issue 9, p093508, 5p, 2 Graphs |
| Abstrakt: |
Zirconium doped lithium niobate is a promising candidate as a substrate for nonlinear optical applications, since it does not suffer from the so-called 'optical damage.' In order to optimize this aspect, the proper Zr concentration has be used, hence the precise determination of the so-called 'threshold concentration,' i.e., the concentration above which the photorefractive effect is markedly reduced, is of great importance. In this work, we prepared by Czochralski growth a series of Zr-doped lithium niobate crystals with various Zr content and studied them using structural (high-resolution x-ray diffraction) and optical (birefringence) measurements as a function of the dopant content in the melt. Both the approaches pointed out a marked change in the crystal characteristics for a Zr concentration between 1.5 and 2 mol %, a value which is identified as the threshold concentration. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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