| Autor: |
Nepijko, S. A., Sedov, N. N., Ziethen, CH., Schönhense, G., Merkel, M., Escher, M. |
| Předmět: |
|
| Zdroj: |
Journal of Microscopy; Aug2000, Vol. 199 Issue 2, p124, 6p |
| Abstrakt: |
Local changes in work function cause deviations of the electrical microfield near a sample surface as a result of the uniform accelerating field distribution between the sample (cathode) and the extractor electrode (anode). This results in a change in the electron trajectories. As a consequence, the microscope image shows remarkable changes in position, size, intensity and lateral resolution of distinct details, which can be quantitatively described by the calculations presented here. Analysing these effects in the image gives an opportunity to determine the real lateral size of the observed structures and the distribution of local contact potentials. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
