An enhanced face recognition technique based on Overlapped Modular PCA approach for cropped Log-polar images.

Autor: Deb, Tamojay, Bhattacherjee, Debotosh, Nasipuri, Mita, Basu, Dipak Kumar, Kundu, Mahantapas
Zdroj: International Journal of Recent Trends in Engineering; Nov2009, Vol. 2 Issue 1, p108-112, 5p
Databáze: Complementary Index