| Autor: |
Yuan, Zhi-min, Liu, Bo, Wang, Jiwen, Ding, Jun |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 5/1/2000, Vol. 87 Issue 9, p6158, 3p |
| Abstrakt: |
Slider disk impact, especially the impact with particles in between, generates flash temperatures at the contact area and creates thermal stress in the magnetic layer of disk media. By modeling the effective magnetic fields of the thermal stress and the thermal agitation, the flash temperature induced magnetic degradation is studied via micro-magnetic simulation. It is noticed that the recorded bit pattern can be fully erased near the area of the maximum thermal stress if the flash temperature approaches 673 K (grain size: 12 nm). The bit patterns with higher bit density corresponds to higher likelihood of data erasure if other conditions are the same. © 2000 American Institute of Physics. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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