| Autor: |
Beom-hoan O, Chul-Hyun Choi, Soo-Beom Jo, Min-Woo Lee, Dong-Gue Park, Byeong-Gwon Kang, Sun-Hyung Kim, Rong Liu, Yang Yang Li, M.J. Sailor, Y. Fainman |
| Zdroj: |
IEEE Photonics Technology Letters; Jun2004, Vol. 16 Issue 6, p1546-1548, 3p |
| Abstrakt: |
The optical form birefringence in porous silicon films is measured by analyzing the transmitted interference intensity of a polarization interferometer. A novel form birefringence model called "boundary condition (BC) model" for porous materials is introduced and evaluated experimentally against samples of porous silicon films. The variation of optical indexes of refraction vs the porosity in silicon films agrees with the calculated values of no/ne within 1% error using the BC model, in contrast to the ∼15% error using effective medium approximation model. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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