| Autor: |
Cassidy, D.R., Cross, G.H. |
| Zdroj: |
IEEE Photonics Technology Letters; 7/15/2007, Vol. 19 Issue 14, p1075-1077, 3p |
| Abstrakt: |
A simple III-V semiconductor dual-slab waveguide interferometer is demonstrated which can detect picometer level changes in the C-band laser wavelength. Optical path length imbalance between the two single-slab waveguide modes provides the primary mechanism for detection. The dual-mode output field phase change differences due to input wavelength changes are encoded in shifts in the device output far-field interference pattern. The device detects path length dependent wavelength changes with a phase change difference sensitivity of around 660 mrad/nmldrmm at 1.55 mum and a phase detection floor of plusmn1 mrad. The transverse electric and transverse magnetic polarization responses are approximately equivalent. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
|
