| Autor: |
Wissel, Larry, Cannon, Ethan H., Heidel, David F., Gordon, Michael S., Rodbell, Kenneth P. |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Nuclear Science; Dec2008 Part 1 of 2, Vol. 55 Issue 6, p3375-3380, 6p, 1 Color Photograph, 1 Diagram, 1 Chart, 4 Graphs |
| Abstrakt: |
This paper presents upset rates of flip-flops in 65 nm commercial bulk technology predicted through modeling, and compares the predictions to upset rates measured with thorium foil, 15 MeV carbon ions, and 148 MeV protons. This paper demonstrates that 15 MeV carbon ions can be used to emulate the daughter products of neutron spallation reactions. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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