| Autor: |
Vayunandana Reddy, Y. K., Wolfman, Jérôme, Autret-Lambert, Cécile, Gervais, Monique, Gervais, François |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; Jun2010, Vol. 107 Issue 10, p106101-106104, 3p, 1 Black and White Photograph, 1 Chart, 2 Graphs |
| Abstrakt: |
High crystalline quality (Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 (BSTZ) thin films were epitaxially grown by pulsed laser deposition on (001) SrTiO3 single crystal substrates. Their epitaxial nature was revealed by x-ray and electron diffraction. Thinnest film (∼9 nm) has largest out-of-plane lattice constant (4.135 Å) and tetragonality (1.06). Films are under compressive strain. Film thicknesses above ∼9 nm were started to relax as revealed from reciprocal space mapping. Thicknesses deduced from x-ray diffraction and transmission electron microscopy methods are in good agreement. Critical thickness to relieve strain of the BSTZ film is about 7.6±0.4 nm. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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