| Autor: |
Tsay, Wen-Chin, Chen, Yen-Ann, Li-Hong Laih, Jyh-Wong Hong, Chen, Augustine E., Lin, Willis T., Yuan-Hann Chang, Hou, Suen R., Chung-Ren Li, Hsien-Jen Ting, Wei-Chen Liang, Cheng, Caleb C.P., Song-Tsang Chiang |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Nuclear Science; Apr98, Vol. 45 Issue 2, p186, 9p, 4 Black and White Photographs, 5 Diagrams, 5 Charts, 1 Graph |
| Abstrakt: |
Presents a study which examined the leakage current of large-area microstrip sensors. Information on the gettering processes employed in this study; What the fabrication process of silicon microstrip sensor consist of; Method used in this study; Results of this study. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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