Failure Mechanisms Associated with the Fabrication of InGaN-Based LEDs.

Autor: Maaskant, Pleun, Akhter, Mahbub, Lambkin, John, Considine, Laurence
Předmět:
Zdroj: IEEE Transactions on Electron Devices; Aug2001, Vol. 48 Issue 8, p1822, 4p, 4 Black and White Photographs, 1 Diagram, 1 Chart, 1 Graph
Abstrakt: Presents a study that investigated the device fabrication and characterization of InGaN/GaN multiple quantum well light-emitting diodes on sapphire substrates. Background on light-emitting diodes in semiconductor devices; Methodology; Results and discussion.
Databáze: Complementary Index