Investigation and Analysis of Mismatching Properties for Nanoscale Strained MOSFETs.
Autor: | Kuo, Jack Jyun-Yan, Chen, William Po-Nien, Pin Su |
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Zdroj: | IEEE Transactions on Nanotechnology; Mar2010, Vol. 9 Issue 2, p248-253, 6p |
Databáze: | Complementary Index |
Externí odkaz: |