| Autor: |
Bailey, S.M., Woods, T.N., Canfield, L.R., Korde, R., Barth, C.A., Solomon, S.C., Rottman, G.J. |
| Zdroj: |
Solar Physics; May1999, Vol. 186 Issue 1/2, p243-257, 15p |
| Abstrakt: |
Measurements of the solar soft X-ray (XUV: 2 nm to 30 nm) irradiance were performed from a sounding rocket payload flown from White Sands Missile Range, New Mexico on 4 October 1993 and again on 3 November 1994. The soft X-ray instrumentation comprised of silicon photodiodes with thin films deposited directly onto their active areas. The deposited material and its thickness in conjunction with the sensitivity of an uncoated diode determine the passband and the sensitivity of these photometric devices. The measurements are interpreted in terms of appropriate SERF 1 (Hinteregger, Fukui, and Gilson, 1981) model solar spectra. It is found that the data are consistent with a solar spectrum that is on average approximately a factor of two times the model solar spectra. It is shown that the measured irradiances are in reasonable agreement with other experiments. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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