| Autor: |
Petrov, A., Tsyganok, Yu., Naiden, E., Levdikova, T., Golovleva, V., Podlesnykh, V., Tret’yakov, A., Vratskikh, V. |
| Zdroj: |
Russian Physics Journal; May1998, Vol. 41 Issue 5, p465-467, 3p |
| Abstrakt: |
We present experimental results for the structural and electrophysical characteristics of YBCO films deposited on sapphire substrates without an interface layer. The films were deposited by laser sputtering of a target. We establish certain relationships between the structural and electrophysical characteristics of the films. We show the films’ electrophysical parameters are determined by the number of "defective" blocks whose [010] axes are at random angles relative to the [100] axis of the substrate. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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