Automatic semiconductor parameter analyzers.
Autor: | Kremin', V. |
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Zdroj: | Measurement Techniques; Sep1998, Vol. 41 Issue 9, p833-836, 4p |
Abstrakt: | An automatic semiconductor parameter analyzer based on an IBM AT personal computer is described. The results of measurements are used to compile banks of mathematical models of various semiconductor devices (bipolar and field-effect transistors, junction and Zener diodes) for use in circuit simulating programs such as PSpice. [ABSTRACT FROM AUTHOR] |
Databáze: | Complementary Index |
Externí odkaz: |