Analysis of thin films and interfaces.
| Autor: | Poate, John M., Tu, King-Ning |
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| Zdroj: | Physics Today; May80, Vol. 33 Issue 5, p34, 5p, 3 Black and White Photographs, 1 Diagram, 1 Graph |
| Abstrakt: | Focuses on advances in the analysis and formation of thin films. Classification of analytic techniques; Types of contacts between transistors and its environment; Structure of silicides. |
| Databáze: | Complementary Index |
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