| Autor: |
Jochum, K. P., Stoll, B., Pfänder, J. A., Seufert, M., Flanz, M., Maissenbacher, P., Hofmann, M., Hofmann, A. W. |
| Zdroj: |
Fresenius' Journal of Analytical Chemistry; Jul2001, Vol. 370 Issue 5, p647-653, 7p |
| Abstrakt: |
Spark source mass spectrometry (SSMS) has experienced important and significant improvements in nearly all analytical features by the use of a multiple ion counting (MIC) system. Two procedures have recently been developed to further increase the analytical capabilities of MIC-SSMS in geochemistry. These are a mathematical correction of interferences, which is often necessary for the ultra trace element analysis of Nb, Ta, Zr, Hf and Y, and the development of an autospark system to hold the total ion beam constant. New analytical data for geological samples, especially international reference materials, are presented using the improved MIC-SSMS technique. The data set consists of high precision and low abundance data for Zr, Nb and Y in depleted reference materials. The MIC-SSMS results are compared with those of conventional SSMS using photoplates for ion detection. The precision of the MIC-SSMS isotope ratio measurements (about 1%) is more than a factor of 3 better than that of conventional SSMS, as demonstrated by analyses of Hawaiian samples. Total uncertainties of MIC-SSMS concentration data including all sources of error are generally between 2 and 5% for concentrations higher than about 0.3 μg/g and about 10% for trace element abundances in the ng/g range. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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