| Autor: |
Charreire, Yves, Cortes, Robert, Nykänen, E., Niinistö, L., Soininen, P., Leskelä, Markku |
| Zdroj: |
Fresenius' Journal of Analytical Chemistry; Sep1998, Vol. 362 Issue 1, p41-50, 10p |
| Abstrakt: |
Extended X-ray absorption fine structure (EXAFS) was used to determine the local structure of the luminescent centers in Tb3+ and Ce3+ -doped strontium sulfide thin films deposited by Atomic Layer Epitaxy (ALE). The rare earths were observed to enter mainly the substitutional sites but at the same time a part of the atoms form RES clusters (RE = rare earth). The presence of both substitutional sites and RES clusters has been observed for the first time in this study for rare earths in II–VI compounds. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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