Microstructural Comparison Between Melt Processed, In-situ Processed and Sintered Tl(Bi)-1223/Ag Tapes Using TEM.

Autor: Eastell, C.J., Moore, J.C., Fox, S., Grovenor, C.R.M., Goringe, M.J.
Zdroj: Journal of Superconductivity; Feb1998, Vol. 11 Issue 1, p11-12, 2p
Abstrakt: We have compared the microstructure of sintered, in-situ and melt processed Tl(Bi)-1223/Ag tapes using TEM. Melt processing of the tapes increases grain connectivity and removes amorphous phases leading to an improvement in the IC/B characteristics of the material. No long range grain alignment, which is the main requirement for improving the properties, was observed in the tapes. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index