| Autor: |
Yasui, Nobuhiro, Ichihara, Sigeru, Nakamura, Takashi, Imada, Aya, Saito, Tatsuya, Ohashi, Yoshihiro, Den, Tohru, Miura, Kenji, Muraoka, Hiroaki |
| Zdroj: |
Journal of Applied Physics; Apr2008, Vol. 103 Issue 7, p07C515, 3p |
| Abstrakt: |
Patterned media with dots of 65 nm period (153 Gdots/in.2) and 25 nm period (1.03 Tdots/in.2) fabricated by a new anodizing process were investigated. Write/read characteristics were successfully measured with a specific patterned marker providing an accessing method to the narrow patterned area of 10×10 μm2. The read-back signals were obtained by a spin stand with a flying head and a static tester with a contact head. Although 1 dot resolution was not achieved in the flying write/read measurement for the media with 25 nm period (1.03 Tdots/in.2), it was achieved in the contact write/read measurement. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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