| Autor: |
Tsang, J. C., Kash, J. A. |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings; 2001, Vol. 550 Issue 1, p526, 6p |
| Abstrakt: |
The timing of switching transitions at the gate level with picosecond accuracy is now an important part of creating high performance integrated circuits (ICs). This need has led to the development of new optical probes to provide local information about electrical activity in flip-chip packaged ICs without disassembly of the chip. The tools use the fact that light at wavelengths near I ...m can penetrate hundreds of microns into silicon, providing a useful probe from the chip's backside. At the same time, optical techniques are now capable of resolving time intervals of picoseconds. These measurement tools include completely passive methods, active methods that can be non- or weakly perturbative, and methods that deliberately perturb the operation of a circuit. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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