| Autor: |
Boch, Jérôme, Velo, Yago Gonzalez, Saigne, Frédéric, Roche, Nicolas J.-H., Schrimpf, Ronald D., Vaillé, Jean-Roch, Dusseau, Laurent, Chatry, Christian, Lorfëvre, Eric, Ecoffet, Robert, Touboul, Antoine D. |
| Předmět: |
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| Zdroj: |
IEEE Transactions on Nuclear Science; Dec2009 Part 1 of 2, Vol. 56 Issue 6, p3347-3353, 7p |
| Abstrakt: |
The enhanced radiation sensitivity exhibited at low dose rate by many bipolar devices remains one of the main concerns for spacecraft reliability. As an accelerated test technique, a new approach based on dose-rate switching experiments has been proposed to characterize bipolar devices. The foundations of this approach are detailed and guidelines for its use are given. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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