| Autor: |
Kawano, Hiroyuki, Ogasawara, Keiko, Kobayashi, Hajime, Tanaka, Akihide, Takahashi, Tomoko, Tagashira, Yasuhide |
| Předmět: |
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| Zdroj: |
Review of Scientific Instruments; Feb1998, Vol. 69 Issue 2, p1182, 3p, 1 Chart, 8 Graphs |
| Abstrakt: |
Describes the relationship among the ionization efficiency, work function, constant temperature and residual gas pressure (P) of surface systems. Selection of P suitable for a thermal positive ion source operation; Implications of the relationship for a molecular beam; Dependence of ionization efficiency on the residual gas pressure. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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