| Autor: |
Dumay, B., Richard, N., David, T., Bourillot, E., Scheurer, F., Beaurepaire, E., Dereux, A., Lacroute, Y. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 1/15/2001, Vol. 89 Issue 2, p1138, 7p, 3 Diagrams, 1 Chart, 6 Graphs |
| Abstrakt: |
Reflectivity measurements in an attenuated total internal reflection (ATIR) geometry and the variation of the transmitted intensity associated to the total electric field in a frustrated ATIR configuration using a photon scanning tunneling microscope (PSTM) of multilayered metallic films are presented as a function of the angle of incidence. Eigenmodes for total reflection and absorption associated with the optical properties of magnetic and nonmagnetic materials are theoretically and experimentally determined from the reflected and the transmitted spectra. Good agreement between theory and experiment demonstrates that PSTM is a powerful technique to characterize accurately and locally drastic variations of the intensity around optical modes of a multilayer system. © 2001 American Institute of Physics. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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