| Autor: |
Bremer, J., Vaicikauskas, V., Hansteen, F., Hunderi, O. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 6/1/2001, Vol. 89 Issue 11, p6177, 6p, 1 Diagram, 8 Graphs |
| Abstrakt: |
The Kerr rotation and ellipticity of Bi[sub 1.8]Y[sub 1.2]Fe[sub 5]O[sub 12] films (Bi:YIG) with the easy axis of magnetization perpendicular to the film plane was investigated in a Kretschmann setup at the wavelength 1.31 μm. The sample was coated by a thin Au film in order to excite plasmons at the free Au surface. An ellipsometric setup, supplemented with a magnetic field oriented perpendicularly to the film plane was used to measure the reflected p and s components of an incoming p polarized wave. The phase difference between the outgoing p and s waves was found by an indirect procedure. A minimum in Kerr rotation and a maximum in Kerr ellipticity could be observed at the surface plasmon resonance angle. Using the Berreman formalism, the experimental curves for the prism/Bi:YIG/Au system could be reproduced by bulk optical constants of the constituents. The asymmetry of the ellipticity curve is demonstrated to arise from a sudden variation in the phase. The effec! ts of the field distribution and the surface roughness are discussed. © 2001 American Institute of Physics. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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