Autor: |
Panina, L. V., Makhnovskiy, D. P., Mapps, D. J., Zarechnyuk, D. S. |
Předmět: |
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Zdroj: |
Journal of Applied Physics; 6/1/2001, Vol. 89 Issue 11, p7221, 3p, 3 Graphs |
Abstrakt: |
This article concerns the effect of the in-plane film size on the magnetoimpedance (MI) characteristics in magnetic/metallic multilayers. The problem is approached by a two-dimensional solution of the Maxwell equations in a symmetrical three-layer film. If the edge effect is neglected, the magnetic flux generated by the current flowing through the film is confined within the outer magnetic layers. In a finite width sandwich, the flux leaks through the inner conductor. This process eventually results in a considerable drop in MI ratio if this width is smaller than the critical flux decay length depending on the effective transverse permeability, layer thickness, and frequency. © 2001 American Institute of Physics. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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