| Autor: |
McNeill, Jason D., O'Connor, Donald B., Barbara, Paul F. |
| Předmět: |
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| Zdroj: |
Journal of Chemical Physics; 5/8/2000, Vol. 112 Issue 18, 17 Black and White Photographs, 6 Diagrams, 8 Graphs |
| Abstrakt: |
Recent developments in the use of near-field scanning optical microscopy-based techniques to monitor and image physical processes related to device function in thin film organic materials are surveyed. By combining subwavelength optical probes with electro-optical spectroscopic techniques, methods have been developed for measuring the dynamics, spatial variation, and diffusion of energy and charge carriers in organic electro-optical devices. Materials investigated include polymer thin films, polycrystalline and amorphous (glassy) organic films, liquid crystalline materials, and molecular semiconductor heterostructures. © 2000 American Institute of Physics. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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