| Autor: |
Peripolli, S. B., Almeida, F. A., Gomes, L. S., Oliveira, F. J., Silva, R. F., Achete, C. A. |
| Předmět: |
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| Zdroj: |
Microscopy & Microanalysis; Jul2009 Supplement 3, Vol. 15 Issue S3, p57-58, 2p, 4 Black and White Photographs |
| Abstrakt: |
The article focuses on the extraction of ultrathin specimens from CVD diamond coated cutting tools using the focused ion beam (FIB) technique. Through this technique, the time spent to the preparation of TEM-ready foil is lower than the conventional cutting and grinding. Using this technique opens a new route for preserving interfaces between dissimilar materials. The FIB also serves as a powerful precision etching technique. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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