Measurements of mechanical resonance and losses in nanometer scale silicon wires.
| Autor: | Carr, Dustin W., Evoy, S. |
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| Zdroj: | Applied Physics Letters; 8/16/1999, Vol. 75 Issue 7, p920, 3p, 1 Black and White Photograph, 3 Graphs |
| Abstrakt: | Presents data on nanofabricated suspended silicon wires driven at resonance. Use of wires that are electrostatically driven and optically detected; Widths and resonant frequencies of the wires; Strong dependence of the resonant quality factor on the surface to volume ratio. |
| Databáze: | Complementary Index |
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