Performance of spherically focusing Ge(444) backscattering analyzers for inelastic x-ray scattering.
| Autor: | Macrander, A.T., Kushnir, V.I. |
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| Zdroj: | Review of Scientific Instruments; Feb1995, Vol. 66 Issue 2, p1546, 3p, 2 Diagrams, 2 Graphs |
| Abstrakt: | Describes a spectrometer designed for use as an undulator source at the Advanced Photon Source in Argonne, Illinois. Inelastic x-ray scattering; Backscattering for the analyzer; Germanium(444) analyzer. |
| Databáze: | Complementary Index |
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