Photoluminescence characterization of Er-implanted Al[sub 2]O[sub 3] films.

Autor:	van den Hoven, G.N., Snoeks, E., Polman, A., van Uffelen, J.W.M., Oei, Y.S., Smit, M.K.
Předmět:	PHOTOLUMINESCENCE THIN films ION implantation
Zdroj:	Applied Physics Letters; 6/14/1993, Vol. 62 Issue 24, p3065, 3p, 4 Graphs
Abstrakt:	Examines the photoluminescence (PL) of erbium (Er)-implanted Al[sub 2]O[sub 3] thin films. Application of thin film optical waveguides in integrated optics; Rate equations governing Er ion excitation and decay; Relation between PL intensity and lifetime.
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu