Current-voltage characteristics and interface state density of GaAs Schottky barrier.

Autor: Maeda, Keiji, Ikoma, Hideaki, Sato, Kenji, Ishida, Toshiki
Předmět:
Zdroj: Applied Physics Letters; 5/17/1993, Vol. 62 Issue 20, p2560, 3p, 2 Diagrams, 2 Graphs
Abstrakt: Examines the density distribution of interface states in GaAs Schottky barrier from nonideal I-V characteristics by the interfacial layer model. Increase of the ideality factor with increasing forward bias voltage; Observation of the fermi level of interface states shifts; Magnitude of the density states.
Databáze: Complementary Index