| Autor: |
Dykaar, D.R., Kopf, R.F., Keil, U.D., Laskowski, E.J., Zydzik, G.J. |
| Předmět: |
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| Zdroj: |
Applied Physics Letters; 4/12/1993, Vol. 62 Issue 15, p1733, 3p, 2 Diagrams, 1 Chart, 2 Graphs |
| Abstrakt: |
Demonstrates an electro-optic sampling probe with femtosecond resolution. Properties of the probe; Use of a simple fabrication technique to produce a total internal reflection probe; Comparison of different probe materials used for fast electro-optic sampling and AlGaAs. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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