Stress induced shift of the Curie point in epitaxial PbTiO[sub 3] thin films.

Autor:	Rossetti Jr., George A., Cross, L. Eric, Kushida, Keiko
Předmět:	CURIE temperature THIN films X-ray diffraction
Zdroj:	Applied Physics Letters; 11/11/1991, Vol. 59 Issue 20, p2524, 3p, 1 Chart, 4 Graphs
Abstrakt:	Examines stress induced shift of the Curie point in epitaxial PbTiO[sub 3] thin films. Use of x-ray diffraction technique; Analysis of the electrostrictive strain; Calculation of the dielectric susceptibility and piezoelectric coefficient.
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu