| Autor: |
Kozyrev, A., Gaidukov, M., Gagarin, A., Altynnikov, A., Osadchy, V., Tumarkin, A., Petrov, P. K., Alford, N. M. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; Jul2009, Vol. 106 Issue 1, p14108-1-14108-4, 4p, 2 Diagrams, 2 Charts, 3 Graphs |
| Abstrakt: |
A method to evaluate the space charge trap energy levels in ferroelectric (FE) Ba0.3Sr0.7TiO3 film incorporated into a metal/FE/metal parallel plate capacitors structure is presented. It is based on microwave measurements of the capacitance relaxation time after the end of a dc pulse, when the change in measured capacitance is due to internal processes of space charge relaxation [Q(t)] in the FE film. Using the Q(t) dependencies obtained as a function of temperature, the time constants of slow relaxation processes were defined and the trap energy levels were evaluated as Et=0.7, 0.5, and 0.1 eV. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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