| Autor: |
Leprince, L., Baumbach, G.T. |
| Předmět: |
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| Zdroj: |
Applied Physics Letters; 12/1/1997, Vol. 71 Issue 22, p3227, 3p, 1 Chart, 5 Graphs |
| Abstrakt: |
Observes strain relaxation phenomena in a strained InGaAsP surface grating resulting from burying in InP through high resolution x-ray diffraction. Comparison of reciprocal space maps of symmetrical and asymmetrical reflections; Indication of the scattered intensity; Occurrence of relaxation in free-surface strained grating. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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