Sequential deposition growth of Bi-Sr-Ca-Cu-O systems observed using in situ reflection...

Autor: Yoshida, I., Kamei, M., Suzuki, K., Morishita, T., Tanaka, S.
Předmět:
Zdroj: Applied Physics Letters; 2/11/1991, Vol. 58 Issue 6, p654, 2p, 6 Black and White Photographs, 1 Diagram, 1 Graph
Abstrakt: Proposes a crystal growth concept for the Bi-Sr-Ca-Cu-O thin film, that is, a unit cell by unit cell growth, which is confirmed in situ reflection high-energy electron diffraction (RHEED) observations during sequential deposition. Adoption of independent shutters for each source controlled by a computer to supply the constituents to a substrate.
Databáze: Complementary Index