| Autor: |
Specht, E.D., Sparks, C.J. |
| Předmět: |
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| Zdroj: |
Applied Physics Letters; 5/4/1992, Vol. 60 Issue 18, p2216, 3p, 5 Graphs |
| Abstrakt: |
Identifies the x-ray diffraction of residual stress in sapphire crystals implanted with Cr[sup +] ions. Measurement of both in-plane and out-of-plane lattice constants; Determination of the Bragg peak positions to identify average stress; Consistency of the x-ray residual stress measurements with the indentation crack length. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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