Microstructure of biepitaxial grain boundary junctions in YBa[sub 2]Cu[sub 3]O[sub 7].

Autor:	Rosner, S.J., Char, K.
Předmět:	MICROSTRUCTURE SEMICONDUCTOR junctions CRYSTAL grain boundaries TRANSMISSION electron microscopy
Zdroj:	Applied Physics Letters; 2/24/1992, Vol. 60 Issue 8, p1010, 3p, 3 Diagrams
Abstrakt:	Examines the microstructure of biepitaxial grain boundary junctions in YBa[sub 2]Cu[sub 3]O[sub 7] using transmission electron microscopy. Growth of YBCO and a buffer layer on a patterned magnesium oxide seed layer; Differences in the microstructure morphology; Factors influencing the ion milling damage to the sapphire surface.
Databáze:	Complementary Index
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