Autor:	Honea, E.C., Ogura, A.
Předmět:	SILICON MICROCLUSTERS RAMAN spectroscopy
Zdroj:	Journal of Chemical Physics; 6/22/1999, Vol. 110 Issue 24, p12161, 12p, 1 Black and White Photograph, 20 Diagrams, 1 Chart, 9 Graphs
Abstrakt:	Studies the structures and coalescence behavior of silicon clusters using surface-plasmon-polariton enhanced Raman spectroscopy. Production of the cluster ions in a laser vaporization source; Deposition and matrix isolation; Raman spectra of small clusters; Effect on Raman intensities from proximity to metal surface.
Databáze:	Complementary Index
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