Optical system for rapid materials characterization with the transient grating technique:....

Autor: Rogers, John A., Fuchs, Martin
Předmět:
Zdroj: Applied Physics Letters; 7/14/1997, Vol. 71 Issue 2, p225, 3p, 2 Diagrams, 2 Graphs
Abstrakt: Describes a means for automating and extending the flexibility of transient grating approach for nondestructive evaluation of materials. Enumeration of attractive characteristics of the method; Presentation of the constructed beam-shaping optics to initiate and detect motions; Illustration of metal film characteristics in microelectronics.
Databáze: Complementary Index