Investigation of minority carrier trapping in n-type doped ZnSe using photoluminescence decay....

Autor: Massa, J.S., Buller, G.S.
Předmět:
Zdroj: Applied Physics Letters; 7/3/1995, Vol. 67 Issue 1, p61, 3p, 1 Chart, 2 Graphs
Abstrakt: Examines the minority carrier trapping in n-type doped zinc selenide using photoluminescence decay measurements. Confirmation of the trapping and recombination process linearity; Impact of temperature on the luminescence intensity; Presence of deep acceptor levels.
Databáze: Complementary Index