| Autor: |
Sim, Chow Hong, Pan, Z. Z., Wang, John |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; Apr2009, Vol. 105 Issue 8, p084113-084120, 7p, 1 Black and White Photograph, 1 Chart, 5 Graphs |
| Abstrakt: |
Multiferroic composite thin films consisting of CoFe2O4 (CFO) and Pb(Zr0.52Ti0.48)O3 (PZT) layers were deposited through a combined route of rf magnetron sputtering and sol gel on Pt(111)/TiO2/SiO2/Si substrates. The coupling effects in the bilayered thin film were studied by looking at the relationships among the crystallite orientation, magnetic behavior, and the in-plane residual stress. Phase selective residual stress analysis conducted by using x-ray method demonstrated a close correlation between the stress imposed on the PZT layer and its texture. A change in the PZT layer orientation from (111) to (010) with the increasing layer thickness was observed in the multiferroic thin film as the system changes from an interface energy minimizing texture to a strain energy density minimizing texture. The CFO phase in the multiferroic thin films was preferably oriented in the (111) orientation. However, there is a change in magnetization as well as coercivity of the multiferroic thin films when the top PZT layer was varied in thickness. A close correlation between the magnetization and the in-plane stress in the CFO bottom layer imposed by the PZT film thickness was observed. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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