| Autor: |
Takenaga, Takashi, Takada, Hiroshi, Tomohisa, Shingo, Furukawa, Taisuke, Kuroiwa, Takeharu, Yoshiara, Kiichi |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; Apr2009, Vol. 105 Issue 7, p07C310-07C313, 3p, 4 Graphs |
| Abstrakt: |
We investigated the exchange-coupling fields of CoFe/Ru (tRu)/CoFe synthetic antiferromagnetic (SyAF) structures with a Ru underlayer and capping layer before and after annealing at 300 and 350 °C. Exchange-coupling field Hex decreased after annealing and distribution increases in Hex were observed in the structure of smaller tRu, especially at tRu≤0.7 nm. Remanence magnetizations increased at smaller tRu. These results indicate that distribution is caused by the existence of the antiferromagnetic coupling of locally various coupling fields due to annealing. A larger exchange-coupling field after high temperature annealing can be obtained by suppressing the distribution of the exchange coupling in the SyAF structure. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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