| Autor: |
Natarajan, V., Rajeswari, B., Dhawale, B. A., Hon, N. S., Godbole, S. V., Manchanda, V. K. |
| Předmět: |
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| Zdroj: |
Journal of Radioanalytical & Nuclear Chemistry; Apr2009, Vol. 280 Issue 1, p27-31, 5p, 1 Diagram, 4 Charts, 2 Graphs |
| Abstrakt: |
Energy dispersive X-ray fluorescence (EDXRF) spectrometric methods have been developed for the determination of some common metallic impurities in ThO2 matrix. A series of ThO2 standards containing the analyte impurities in the range 10–100 (or 100–500) μg/g was prepared synthetically. The spectrometer conditions were optimized to obtain calibration plots for the various analytes. The accuracy and precision of the developed methodology for regular assay of ThO2 was evaluated by analyzing three synthetic samples. Further three secondary ThO2 standards were analyzed by EDRXF to check the developed methods. The determined concentrations of Ca, Cr, Fe, Ni and Cu were in good agreement with the certified values of the secondary standards. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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