| Autor: |
HERKSTRÖTER, F. M., TEN BOSCH, J. J. |
| Předmět: |
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| Zdroj: |
Journal of Dental Research; Aug1990, Vol. 69 Issue 8, p1522-1526, 5p, 1 Chart, 6 Graphs |
| Abstrakt: |
Wavelength-independent Microradiography (WIM), described in this paper, used polychromatic, high-energy (≤ 60 kV) x-rays for determination of mineral concentrations in tooth material non-destructively. This was done with the aid of a reference step-wedge made of 94% aluminum, 6% zinc. The mass attenuation coefficient of this material has a wavelength-independent ratio to the mass attenuation coefficients of enamel and dentin. With this method, mineral concentrations of enamel and dentin samples, with a thickness up to 500 Am, were determined at 20- and at 60-kV tube voltage. The samples were demineralized for 72 and 144 h and measured again. Comparison of the data showed that mineral quantification was within 1.5%, independent of the x-rays used. Finally, these mineral concentrations--obtained from the Wavelength-independent Microradiography--were compared with measurements of the same samples by Longitudinal Microradiography. A correlation of 0.99 was found for enamel and one of 0.96 for dentin. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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