| Autor: |
Goddard, Lynford L., Kneissl, Michael, Bour, David P., Johnson, N. M. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; 10/1/2000, Vol. 88 Issue 7, p3820, 4p, 1 Diagram, 6 Graphs |
| Abstrakt: |
Describes a method to measure small changes in gain and distributed loss in laser diodes during life testing. Computation of the evolution of the gain spectrum by measuring the true spontaneous emission spectrum and the lasing wavelength of the diode with time; Investigation of the gain spectrum of InGaN multiple quantum well ridge waveguide laser diodes. |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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