| Autor: |
Mamontov, E., Zamponi, M., Hammons, S., Keener, W. S., Hagen, M., Herwig, K. W. |
| Předmět: |
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| Zdroj: |
Neutron News; Jul-Sep2008, Vol. 19 Issue 3, p22-24, 3p, 1 Black and White Photograph, 2 Graphs |
| Abstrakt: |
A new spectrometer named BASIS has recently entered the general user program at the Spallation Neutron Source. BASIS is an acronym for Backscattering Silicon Spectrometer. While there are several operational reactor-based spectrometers that utilize backscattering reflection from silicon single crystals, such as IN10 and IN16 [1] at the ILL, France; HFBS [2] at the NCNR, USA; and SPHERES [3] at the FRM-II, JCNS, Germany, BASIS is the first silicon backscattering spectrometer built on a spallation neutron source. Conceptually, it is similar to previously built time-of-flight backscattering spectrometers that utilize reflections from pyrolytic graphite or mica, such as IRIS [4] and OSIRIS [5] at the ISIS, UK; LAM-80 [6] at the KENS, Japan; or MARS [7] at the SINQ, Switzerland. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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